TLV5625ID
TLV5625ID is Low-Power Dual 8-Bit Digital-to-Analog Converter manufactured by Texas Instruments.
- Part of the TLV5625 comparator family.
- Part of the TLV5625 comparator family.
features
D Dual 8-Bit Voltage Output DAC D Programmable Internal Reference D Programmable Settling Time
- 3 µs in Fast Mode
- 10 µs in Slow Mode
D patible With TMS320 and SPI Serial
Ports
D Differential Nonlinearity <0.2 LSB Max D Monotonic Over Temperature applications D Digital Servo Control Loops D Digital Offset and Gain Adjustment D Industrial Process Control D Machine and Motion Control Devices D Mass Storage Devices
D PACKAGE (TOP VIEW) description
The TLV5625 is a dual 8-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface is patible with TMS320, SPI, QSPI, and Microwire serial ports. It is programmed with a 16-bit serial string containing 4 control and 8 data bits.
DIN 1 SCLK 2
CS 3 OUTA 4
8 VDD 7 OUTB 6 REF 5 AGND
The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a Class-AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed versus power dissipation.
Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package in standard mercial and industrial temperature ranges.
AVAILABLE OPTIONS
PACKAGE
SOIC
(D)
0°C to 70°C
TLV5625CD
- 40°C to 85°C
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI and QSPI are trademarks of Motorola, Inc. Microwire is a trademark of National Semiconductor Corporation.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright 2002, Texas Instruments Incorporated
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