SLVS287B – SEPTEMBER 2000 – REVISED SEPTEMBER 2007
FOUR-PORT USB HUB POWER CONTROLLERS
•2 Complete USB Hub Power Solution
• Meets USB Specifications 1.1 and 2.0
• Independent Thermal and Short-Circuit
• 3.3-V Regulator for USB Hub Controller
• Overcurrent Logic Outputs
• 4.5-V to 5.5-V Operating Range
• CMOS- and TTL-Compatible Enable Inputs
• 185 μA Bus-Power Supply Current
• Available in 32-Pin HTSSOP PowerPAD™
• –40°C to 85°C Ambient Temperature Range
The TPS2070 and TPS2071 provide a complete USB
hub power solution by incorporating four major
functions: current-limited power switches for four
ports, a 3.3-V 100-mA regulator, a 5-V regulator
controller for self-power, and a DP0 line control to
signal attach/detach of the hub.
These devices are designed to meet bus-powered
and self-powered hub requirements. These devices
are also designed for hybrid hub implementations and
allow for automatic switching from self-powered mode
to bus-powered mode if loss of self-power is
experienced (can be disabled by applying a logic high
Each port has a current-limited 107-mΩ N-channel
MOSFET high-side power switch for 500-mA
self-powered operation. Each port also has a
current-limited 560-mΩ N-channel MOSFET high-side
power switch for 100-mA bus-powered operation. All
the N-channel MOSFETs are designed without
parasitic diodes, preventing current backflow into the
For applications not requiring a 5-V regulator
controller, use the TPS2074 or TPS2075 device.
NC - No internal connection
(1) Pin 12 is active-low (BPMODE) for
TSS2070 and active-high (BPMODE) for
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2007, Texas Instruments Incorporated