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TPS40060
8
TPS40061
SLUS543F – DECEMBER 2002 – REVISED JUNE 2013
WIDE-INPUT SYNCHRONOUS BUCK CONTROLLER
Check for Samples: TPS40060, TPS40061
FEATURES
1
•2 Operating Input Voltage 10 V to 55 V
• Input Voltage Feed-Forward Compensation
• < 1% Internal 0.7-V Reference
• Programmable Fixed-Frequency, Up to 1-MHz
Voltage Mode Controller
• Internal Gate Drive Outputs for High-Side P-
Channel and Synchronous N-Channel
MOSFETs
• 16-Pin PowerPAD™ Package (θJC = 2°C/W)
• Thermal Shutdown
• Externally Synchronizable
• Programmable High-Side Sense Short Circuit
Protection
• Programmable Closed-Loop Soft-Start
• TPS40060 Source Only/TPS40061 Source/Sink
APPLICATIONS
• Networking Equipment
• Telecom Equipment
• Base Stations
• Servers
DESCRIPTION
The TPS40060 and TPS40061 are high-voltage, wide
input (10 V to 55 V) synchronous, step-down
converters.
This family of devices offers design flexibility with a
variety of user programmable functions, including;
soft-start, UVLO, operating frequency, voltage feed-
forward, high-side current limit, and loop
compensation. These devices are also
synchronizable to an external supply.
The TPS40060 and TPS40061 incorporate MOSFET
gate drivers for external P-channel high-side and N-
channel synchronous rectifier (SR) MOSFETs. Gate
drive logic incorporates anti-cross conduction circuitry
to prevent simultaneous high-side and synchronous
rectifier conduction.
SIMPLIFIED APPLICATION DIAGRAM
TPS40060PWP
1 KFF
ILIM 16
2 RT
VIN 15
VIN
3 BP5
HDRV 14
4 SYNC BPN10 13
5 SGND
SW 12
6 SS/SD BP10 11
7 VFB
LDRV 10
8 COMP PGND 9
+
VOUT
-
UDG-02157
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2013, Texas Instruments Incorporated
