Part number:
MMBV609
Manufacturer:
Leshan Radio Company
File Size:
52.72kb
Download:
Description:
Silicon tuning diode.
PDF File Details
MMBV609
Leshan Radio Company
52.72kb
Silicon tuning diode.
📁 Related Datasheet
MMBV609LT1 - Silicon Tuning Diode
(Motorola)
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Silicon Tuning Diode
This device is designed for FM tuning, general frequency control and tuning, or any top–of.
MMBV609LT1 - Silicon Tuning Diode
(Leshan Radio Company)
.
MMBV609LT1 - Silicon Tuning Diode
(ON Semiconductor)
..
MMBV609LT1
Preferred Device
Silicon Tuning Diode
This device is designed for FM tuning, general frequency control and tuning, or.
MMBV105G - VOLTAGE VARIABLE CAPACITANCE DIODE
(Motorola)
.
MAXIMUM RATINGS
Rating Reverse Voltage Forward Current
Symbol VR
if .
THERMAL CHARACTERISTICS
Characteristic
Symbol
Total Device Dissipation,.
MMBV105GLT1 - Silicon Tuning Diode
(Motorola)
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Silicon Tuning Diode
This device is designed in the Surface Mount package for general frequency control and tun.
MMBV105GLT1 - Silicon Tuning Diode
(Leshan Radio Company)
LESHAN RADIO COMPANY, LTD.
Silicon Tuning Diode
This device is designed in the surface Mount package for general frequency control and tuning applica.
MMBV105GLT1 - Silicon Tuning Diode
(ON)
ON Semiconductort
Silicon Tuning Diode
This device is designed in the Surface Mount package for general frequency control and tuning applications. It.
MMBV109 - VOLTAGE VARIABLE CAPACITANCE DIODE
(Motorola)
MMBV109
CASE 318-02/03, STYLE 8
SOT-23 (TO-236AA/AB)
VOLTAGE VARIABLE CAPACITANCE DIODE
MAXIMUM RATINGS
Rating Reverse Voltage Forward Current
Symbo.
MMBV109LT1 - Silicon Epicap Diodes
(Motorola)
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Silicon Epicap Diodes
Designed for general frequency control and tuning applications; providing solid–state rel.
MMBV109LT1 - Silicon Epicap Diode
(Leshan Radio Company)
LESHAN RADIO COMPANY, LTD.
Silicon Epicap Diode
Designed for general frequency control and tuning applications; providing solid–state reliability in .
