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SE97B Datasheet - NXP Semiconductors

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SE97B DDR memory module temp sensor

SE97B Rev.01 * 27 January 2010 www.DataSheet4U.com DDR memory module temp sensor with integrated SPD Product data sheet 1.General descrip.
Meets JEDEC Specification 42. 40 °C to +125 °C with JEDEC Grad.

SE97B_NXPSemiconductors.pdf

Preview of SE97B PDF

Datasheet Details

Part number:

SE97B

Manufacturer:

NXP ↗ Semiconductors

File Size:

453.81 KB

Description:

DDR memory module temp sensor

Features

* SE97 old JEDEC specification no SMBus Timeout SMBus Timeout 25 ms to 35 ms 400 kHz VIL(max) = 0.3 × VDD; VIH(min) = 0.7 × VDD set to 0 frozen set to 0 yes set to 0 50 ns 1010 0010 0000 0001 Grade B 0.6 V 3.0 V to 3.6 V 3.0 V to 3.6 V 1.7 V to 3.6 V assembly plant Hong Kong 3.0 V to 3.6 V assembly pl

Applications

* When the temperature changes beyond the specified boundary limits, the SE97B outputs an EVENT signal using an open-drain output that can be pulled up between 0.9 V and 3.6 V. The user has the option of setting the EVENT output signal polarity as either an active LOW or active HIGH comparator output

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