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SCAN921025H - High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes

Description

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock.

The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Features

  • provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed. The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count,.

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Full PDF Text Transcription

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December 2005 www.DataSheet4U.com SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit BLVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST SCAN921025H and SCAN921226H High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST General Description The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.
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