Download ST95P08 Datasheet PDF
STMicroelectronics
ST95P08
ST95P08 is 8 Kbit Serial SPI EEPROM manufactured by STMicroelectronics.
DESCRIPTION The ST95P08 is an 8 Kbit Electrically Erasable Programmable Memory (EEPROM) fabricated with STMicroelectronics’s High Endurance Single Polysilicon CMOS technology. The 8 Kbit memory is organised as 64 pages of 16 bytes. The memory is accessed by a simple SPI bus patible serial interface. The bus signals are a serial clock input (C), a serial data input (D) and a serial data output (Q). The device connected to the bus is selected when the chip select input (S) goes low. munications with the chip can be interrupted with a hold input (HOLD). The write operation is disabled by a write protect input (W). Figure 1. Logic Diagram D C S ST95P08 Table 1. Signal Names C D Q S W HOLD VCC VSS February 1999 Serial Clock Serial Data Input Serial Data Output Chip Select Write Protect Hold Supply Voltage Ground W HOLD AI01315 1/16 Figure 2A. DIP Pin Connections Figure 2B. SO Pin Connections ST95P08 S Q W VSS 1 2 3 4 8 7 6 5 AI01316 VCC HOLD C D S Q W VSS 1 2 3 4 8 7 6 5 AI01317B VCC HOLD C D Table 2. Absolute Maximum Ratings (1) Symbol TA TSTG TLEAD VO VI VCC VESD Parameter Ambient Operating Temperature (2) Storage Temperature Lead Temperature, Soldering Output Voltage Input Voltage Supply Voltage Electrostatic Discharge Voltage (Human Body model) (3) Electrostatic Discharge Voltage (Machine model) (4) Value - 40 to 85 - 65 to 150 Unit °C °C °C V V V V V (SO8 package) (PSDIP8 package) 40 sec 10 sec 215 260 - 0.3 to VCC +0.6 - 0.3 to 6.5 - 0.3 to 6.5 4000 500 Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the...