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SN54ABT8245 SCAN TEST DEVICES

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SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124D * AUGUST 1992 * REVISED DECEMBER 1996 D Members of th.
The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

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* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas In

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