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SN74ABTH182646A, SN74ABTH18646A Datasheet - Texas Instruments

SN74ABTH18646A-etcTI.pdf

This datasheet PDF includes multiple part numbers: SN74ABTH182646A, SN74ABTH18646A. Please refer to the document for exact specifications by model.
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Datasheet Details

Part number:

SN74ABTH182646A, SN74ABTH18646A

Manufacturer:

Texas Instruments ↗

File Size:

883.32 KB

Description:

Scan test devices.

Note:

This datasheet PDF includes multiple part numbers: SN74ABTH182646A, SN74ABTH18646A.
Please refer to the document for exact specifications by model.

SN74ABTH182646A, SN74ABTH18646A, SCAN TEST DEVICES

The ’ABTH18646A and ’ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board ass

SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D AUGUST 1993 REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of

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