TLV5638-EP Datasheet | Texas Instruments

features D Controlled Baseline - One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance up to - 55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product Change Notification D Qualification Pedigree† D Dual 12-Bit Voltage Output DAC D Programmable Internal Reference D Programmable Settling Time: 1 µs in Fast Mode, 3.5 µs in Slow Mode † ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits. D patible With TMS320 and SPI Serial Ports D Differential Nonlinearity <0.5 LSB Typ D Monotonic Over Temperature...