RTAX4000S Datasheet | Actel Corporation

v5.3 .. RTAX-S/SL RadTolerant FPGAs Radiation Performance - SEU-Hardened Registers Eliminate the Need for TripleModule Redundancy (TMR) - Immune to Single-Event Upsets (SEU) to LETTH > 37 MeV-cm2/mg - SEU Rate < 10-10 Errors/Bit-Day in Worst-Case Geosynchronous Orbit Expected SRAM Upset Rate of <10-10 Errors/Bit-Day with Use of Error Detection and Correction (EDAC) IP (included) with Integrated SRAM Scrubber - Single-Bit Correction, Double-Bit Detection - Variable-Rate Background Refreshing Total Ionizing Dose Up to 300 krad (Si, Functional) Single-Event Latch-Up Immunity (SEL) to LETTH > 117 MeVcm2/mg TM1019 Test Data Available Single Event Transient (SET) - No Anomalies...