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Standard Products
UT67164 Radiation-Hardened 8K x 8 SRAM -- SEU Hard
Data Sheet
January 2002
FEATURES
q 55ns maximum address access time, single-event upset less than 1.0E-10 errors//bit day (-55oC to 125+oC)
q Asynchronous operation for compatibility with industrystandard 8K x 8 SRAM
q TTL-compatible input and output levels q Three-state bidirectional data bus q Low operating and standby current
q Full military operating temperature range, -55oC to 125+oC, screened to specific test methods listed in Table I MIL-STD883 Method 5004 for Class S or Class B
q Radiation-hardened process and design; total dose irradiation testing to MIL-STD-883 Method 1019
- Total-dose: 1.0E6 rads(Si)
- Dose rate upset: 1.0E9 rads (Si)/sec - Dose rate survival: 1.0E12 rads (Si)/sec
- Single-event upset: <1.
UT67164 Datasheet
