A3425 Datasheet PDF - Allegro MicroSystems Ultra-Sensitive Dual-Channel Quadrature Hall-Effect Bipolar Switch Specs

A3425 - Ultra-Sensitive Dual-Channel Quadrature Hall-Effect Bipolar Switch

Datasheet Summary

Description

Chopper-Stabilized Technique.

These devices use a proprietary dynamic offset cancellation technique, with an internal high-frequency clock to reduce the residual offset voltage of the Hall element that is normally caused by device overmolding, temperature dependencies, and thermal stress.

Features

I Two Matched Hall Switches On A Single Substrate I I I I I I I I 1 mm Sensor-to-Sensor Spacing Superior Temperature Stability Resistant to Physical Stress Output Short-Circuit Protection Operation From Unregulated Supply Reverse Battery Protection Solid-State Reliability Integrated ESD Protection on Outputs and Supply Always order by complete part number, e. g. , A3425LK . 3425 DUAL,.

Datasheet Details

Part number	A3425
Manufacturer	Allegro MicroSystems
File Size	411.01 KB
Description	Ultra-Sensitive Dual-Channel Quadrature Hall-Effect Bipolar Switch
Datasheet	A3425 Datasheet
Additional preview pages of the A3425 datasheet.

📁 Similar Datasheet

A3421 - Hall Effect Direction Detection Sensor (Allegro)

A3423 - Dual Channel Hall Effect Direction Detection Sensor (Allegro)

A34 - 100 TO 2000 MHz CASCADABLE AMPLIFIER (Tyco Electronics)

A34063A - DC-DC CONVERTER (AiT Semiconductor)

A341 - Triode (Philips)

A34M414 - 32-bit Microcontroller (ABOV)

A34M416 - 32-bit Microcontroller (ABOV)

A34M418 - 32-bit Microcontroller (ABOV)

Full PDF Text Transcription

Click to expand full text

3425 DUAL, CHOPPER-STABILIZED, ULTRA-SENSITIVE, BIPOLAR HALL-EFFECT SWITCH The A3425LK dual Hall-effect switch is an extremely temperature-stable and stress-resistant sensor especially suited for use in digital-encoder systems in the harsh environments of automotive or industrial applications over extended temperature ranges to +150°C. Superior high-temperature performance is made possible through dynamic offset cancellation, which reduces the residual offset voltage normally caused by device overmolding, temperature dependencies, and thermal stress. This device also eliminates the major manufacturing hurdles encountered in fine-pitch direction-detection applications, namely maintaining accurate mechanical location between the two active Hall elements.

Published: Mar 23, 2005 |