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This
report
presents
the
qual
ification
test
results-on-NE272
series.
2/8
1.Test --
Device
NE272 AI GaAs /In GaAs hetero-junction FEr
2.Qualification
A serres of
tests
Qual ification tests consists of following rierns
l)High 2)High
The The test test
temperature temperature
conditions parameters
DC Bias Reverse
and were
Test Bias
( H T p T ) Test
are before
( H T R B T )
shown and in after Table the 1. tests.
sample
size
measured
bk~t
Resu
lli
The l)High The
summary
of
qual
ification DC Bias
test Test has been
result
is
presented
in
Table
3-1,3-2.
Temperature followingfcondition
ID=10mA
adopted:
VDs=2V
The The The test test
T ch= 175°C
results elapsed of all
are for
shown 5000
in hours
Table under are
3-1 the
and
Fig.
GET-30569 Datasheet
