GET-30569 Datasheet | CEL

.. This report presents the qual ification test results-on-NE272 series. 2/8 1.Test -- Device NE272 AI Ga As /In Ga As hetero-junction FEr 2.Qualification A serres of tests Qual ification tests consists of following rierns l)High 2)High The The test test temperature temperature conditions parameters DC Bias Reverse and were Test Bias ( H T p T ) Test are before ( H T R B T ) shown and in after Table the 1. tests. sample size measured bk~t Resu lli The l)High The summary of qual ification DC Bias test Test has been result is presented in Table 3-1,3-2. Temperature followingfcondition ID=10m A adopted: VDs=2V The The The test test T ch= 175°C results elapsed of all are for shown 5000 in hours Table under are 3-1 the and Fig.1 (1)-Fig.1(8) condition. crilteria. above the delta changes parameters withjn 2)High The temperature following '4V results elapsed of all DC Bias condition Test has been adopted: VGDS=. T ch= 150°C are for shown 5000 parameters in hours are Table under within 3-2 the and Fig.2(1)-F:jg.2(8). condition. criteria. The The The test test changes above the delta 4.Conclusion From t is the concluded series of that: qual ification test results described above l)There 2) There is no degradation test. is no degradation test. UP to 5000 hours at Tch=l75°C UP to 5000 hours at Tch=l SO°C in High temperature in High temperature DC bias Reverse bias NE272 is qua fied for high rei iabi ity appl...