EN25F40
EN25F40 is 4 Mbit Serial Flash Memory manufactured by Elite Semiconductor Microelectronics Technology.
FEATURES
- Single power supply operation
- Full voltage range: 2.7-3.6 volt
- 4 Mbit Serial Flash
- 4 M-bit/512 K-byte/2048 pages
- 256 bytes per programmable page
- High performance
- 100MHz clock rate
- Low power consumption
- 5 m A typical active current
- 1 μA typical power down current
- Uniform Sector Architecture: 128 sectors of 4-Kbyte 8 blocks of 64-Kbyte Any sector or block can be erased individually
- Write Protect all or portion of memory via software
- Enable/Disable protection with WP# pin
- High performance program/erase speed Page program time: 1.5ms typical Sector erase time: 150ms typical Block erase time 800ms typical Chip erase time: 5 Seconds typical
- Lockable 256 byte OTP security sector
- Minimum 100K endurance cycle
- Package Options 8 pins SOP 150mil body width 8 pins SOP 200mil body width 8 contact VDFN 8 pins PDIP All Pb-free packages are Ro HS pliant
- Software and Hardware Write Protection:
- mercial and industrial temperature Range
GENERAL DESCRIPTION
The EN25F40 is a 4M-bit (512K-byte) Serial Flash memory, with advanced write protection mechanisms, accessed by a high speed SPI-patible bus. The memory can be programmed 1 to 256 bytes at a time, using the Page Program instruction.
The EN25F40 is designed to allow either single Sector at a time or full chip erase operation. The EN25F40 can be configured to protect part of the memory as the software protected mode. The device can sustain a minimum of 100K program/erase cycles on each sector.
This Data Sheet may be revised by subsequent versions 1 or modifications due to changes in technical specifications.
©2004 Eon Silicon Solution, Inc., .essi..tw
Rev. B, Issue Date: 2007/05/09
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Figure.1 CONNECTION DIAGRAMS
- LEAD SOP / PDIP
- CONTACT VDFN
Figure 2. BLOCK DIAGRAM
This Data Sheet may be revised by subsequent versions or modifications due to changes in technical specifications.
©2004 Eon Silicon Solution, Inc., .essi..tw
Rev. B, Issue Date:...