SCAN18245T Datasheet | Fairchild Semiconductor

SCAN18245T Non-Inverting Transceiver with 3-STATE Outputs October 1991 Revised May 2000 SCAN18245T Non-Inverting Transceiver with 3-STATE Outputs General Description The SCAN18245T is a high speed, low-power bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This device is pliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundaryscan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). Features s IEEE 1149.1 (JTAG) pliant s Dual...