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MMA1260KEG - Low G Micromachined Accelerometer

General Description

PCB Layout STATUS Accelerometer ST VOUT VSS VDD R 1 kΩ C 0.1 μF VRH C 0.1 μF P1 Microcontroller P0 A/D In C 0.1 μF VSS VSS VSS VOUT STATUS VDD VSS ST 1 2 3 4 5 6 7 8 16 15 14 13 12 11 10 9 N/C N/C N/C N/C N/C N/C N

Key Features

  • Integral Signal Conditioning Linear Output 2nd Order Bessel Filter Calibrated Self-test EPROM Parity Check Status Transducer Hermetically Sealed at Wafer Level for Superior Reliability Robust Design, High Shock Survivability Qualified AEC-Q100, Rev. F Grade 2 (-40°C/ +105°C) MMA1260KEG MMA1260KEG: Z-AXIS.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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Freescale Semiconductor Technical Data MMA1260KEG Rev 0, 11/2009 Low G Micromachined Accelerometer The MMA series of silicon capacitive, micromachined accelerometers feature signal conditioning, a 2-pole low pass filter and temperature compensation. Zero-g offset full scale span and filter cut-off are factory set and require no external devices. A full system self-test capability verifies system functionality. Features • • • • • • • • Integral Signal Conditioning Linear Output 2nd Order Bessel Filter Calibrated Self-test EPROM Parity Check Status Transducer Hermetically Sealed at Wafer Level for Superior Reliability Robust Design, High Shock Survivability Qualified AEC-Q100, Rev. F Grade 2 (-40°C/ +105°C) MMA1260KEG MMA1260KEG: Z-AXIS SENSITIVITY MICROMACHINED ACCELEROMETER ±1.