MMA1270 - Micromachined Accelerometer

Freescale Semiconductor (now NXP Semiconductors)

Features

Integral Signal Conditioning.
Linear Output.
2nd Order Bessel Filter.
Calibrated Self-test.
EPROM Parity Check Status.
Transducer Hermetically Sealed at Wafer Level for Superior Reliability.
Robust Design, High Shock Survivability Typical.

MMA1270 micromachined accelerometer by Freescale Semiconductor - Datasheet Preview

Datasheet Details

Part number	MMA1270
Manufacturer	Freescale Semiconductor (now NXP Semiconductors)
File Size	138.83 KB
Description	Micromachined Accelerometer
Datasheet	MMA1270 Datasheet

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Other Datasheets by Freescale Semiconductor (now NXP Semiconductors)

Part Number	Description
MMA1270EG	Low G Micromachined Accelerometer
MMA1270KEG	Micromachined Accelerometer
MMA1200	Surface Mount Micromachined Accelerometer
MMA1200D	Surface Mount Micromachined Accelerometer
MMA1210	Surface Mount Micromachined Accelerometer

Full PDF Text Transcription

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Freescale Semiconductor Technical Data Low G Micromachined Accelerometer The MMA series of silicon capacitive, micromachined accelerometers feature signal conditioning, a 2-pole low pass filter and temperature compensation. Zero-g offset full scale span and filter cut-off are factory set and require no external devices. A full system self-test capability verifies system functionality.

Published: Nov 29, 2017 |