DESCRIPTION
For applications requiring component reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is initially compiled from reliability tests run prior to market introduction to demon- strate that a product meets design criteria. Additional tests are run periodically. 400 350 300 APPLICATIONS
This information represents the capabilities of the generic device. Failure rates and MTTF values presented here are achievable with normal MIL-S-19500 TX level screening. The screening tests, references, conditions, lot sizes, and LTPD are provided as references only. 250 200 150 EA = 1.3 eV 100 JUNCTION TEMPERATURE, Tj (°C) 50 25 102 103 104 105 106 107 MEAN TIME TO FAILURE, MTTF (HRS) 108 Mean Time to Failure vs
Hewlett-Packard
