1N5767
1N5767 is PIN Diodes manufactured by HP.
Description
For applications requiring ponent reliability estimation,
Hewlett-Packard provides reliability data for all families of devices. Data is initially piled from reliability tests run prior to market introduction to demon- strate that a product meets design criteria. Additional tests are run periodically. The data on this sheet represents the latest review of accumulated test results.
Applications
This information represents the capabilities of the generic device. Failure rates and MTTF values presented here are achievable with normal MIL-S-19500 TX level screening. This reliability screening is no longer available from Hewlett-Packard. The screening tests, references, conditions, lot sizes, and LTPD are provided as references only.
150 EA = 1.3 e V
JUNCTION TEMPERATURE, Tj (°C)
50 25
103 104 105 106 107 MEAN TIME TO FAILURE, MTTF (HRS)
Mean Time to Failure...
