Description
The HR2000 gate arrays are performance oriented seaof-transistor arrays, fabricated on Honeywell’s 0.65 µm RICMOS™ IV bulk CMOS process.
Features
- Fabricated on Honeywell’s Radiation Hardened 0.65 µmLeff RICMOS™ IV Bulk Process.
- Array Sizes from 10K to 336K Available Gates (Raw).
- TTL or CMOS Compatible I/O.
- Full Complement of Screening Flows
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HR2000
FAMILY.
- Total Dose Hardness ≥1x106 rad(SiO2).
- Dose Rate Upset Hardness ≥1x109 rad(Si)/sec.
- Dose Rate Survivability ≥1x1012 rad (Si)/sec.
- Soft Error Rate ≤1x10-10 Errors/Bit/Day.
- Neutron Fluenc.