Infineon Technologies S29GL128S
The S29GL01G/512/256/128S are MIRRORBIT™ Eclipse flash products fabricated on 65-nm process technology. These devices offer a fast page access time as fast as 15 ns with a corresponding random access time as fast as 90 ns. They feature a Write Buffer that allows a maximum of 256 words/512 bytes to be programmed in one operation, resulting in faster effective programming time than standard programming algorithms.S29GL01GS, S29GL512S, S29GL256S, S29GL128S 128 Mb/256 Mb/512 Mb/1 Gb GL-S MIRRORBIT™ flash Parallel, 3.0 V General description This makes these devices ideal for today’s embedded applications that require higher density, better performance and lower power consumption. Distinctive characteristics
● CMOS 3.0 V core with versatile I/O
● 65 nm MIRRORBIT™ Eclipse technology
● Single supply (VCC) for read / program / erase (2.7 V to 3.6 V)
● Versatile I/O feature - Wide I/O voltage range (VIO): 1.65 V to VCC
● ×16 data bus
● Asynchronous 32-byte page read
● 512-byte programming buffer - Programming in page multiples, up to a maximum of 512 bytes
● Single word and multiple program on same word options
● Automatic error checking and correction (ECC) – internal hardware ECC with single bit error correction
● Sector erase - Uniform 128-kbyte sectors
● Suspend and resume commands for program and erase operations
● Status register, data polling, and ready/busy pin methods to determine device statu...
● CMOS 3.0 V core with versatile I/O
● 65 nm MIRRORBIT™ Eclipse technology
● Single supply (VCC) for read / program / erase (2.7 V to 3.6 V)
● Versatile I/O feature - Wide I/O voltage range (VIO): 1.65 V to VCC
● ×16 data bus
● Asynchronous 32-byte page read
● 512-byte programming buffer - Programming in page multiples, up to a maximum of 512 bytes
● Single word and multiple program on same word options
● Automatic error checking and correction (ECC) – internal hardware ECC with single bit error correction
● Sector erase - Uniform 128-kbyte sectors
● Suspend and resume commands for program and erase operations
● Status register, data polling, and ready/busy pin methods to determine device statu...