• Part: IDT49C460
  • Description: 32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT
  • Manufacturer: Integrated Device
  • Size: 714.46 KB
Download IDT49C460 Datasheet PDF
Integrated Device
IDT49C460
IDT49C460 is 32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT manufactured by Integrated Device.
32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT Integrated Device Technology, Inc. IDT49C460 IDT49C460A IDT49C460B IDT49C460C IDT49C460D IDT49C460E Features : - Fast - IDT49C460E - IDT49C460D - IDT49C460C - IDT49C460B - IDT49C460A - IDT49C460 Low-power CMOS - mercial: 95m A (max.) - Military: 125m A (max.) Improves system memory reliability - Corrects all single bit errors, detects all double and some triple-bit errors Cascadable - Data words up to 64-bits Built-in diagnostics - Capable of verifying proper EDC operation via software control Simplified byte operations - Fast byte writes possible with separate byte enables Functional replacement for 32- and 64-bit configurations of the AM29C60 and AM29C660 Available in PGA, PLCC and Fine Pitch Flatpack Military product pliant to MIL-STD-883, Class B Standard Military Drawing #5962- 88533 Detect 10ns (max.) 12ns (max.) 16ns (max.) 25ns (max.) 30ns (max.) 40ns (max.) Correct 14ns (max.) 18ns (max.) 24ns (max.) 30ns (max.) 36ns (max.) 49ns (max.) DESCRIPTION: The IDT49C460s are high-speed, low-power, 32-bit Error Detection and Correction Units which generate check bits on a 32-bit data field according to a modified Hamming Code and correct the data word when check bits are supplied. The IDT49C460s are performance-enhanced functional replacements for 32-bit versions of the 2960. When performing a read operation from memory, the IDT49C460s will correct 100% of all single bit errors and will detect all double bit errors and some triple bit errors. The IDT49C460s are easily cascadable to 64-bits. Thirtytwo-bit systems use 7 check bits and 64-bit systems use 8 check bits. For both configurations, the error syndrome is made available. The IDT49C460s incorporate two built-in diagnostic modes. Both simplify testing by allowing for diagnostic data to be entered into the device and to execute system diagnostics functions. They are fabricated using a CMOS technology designed for high-performance and high-reliability. The...