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ACS541MS - Radiation Hardened Octal Buffer/Line Driver

General Description

The Intersil ACS541MS is a Radiation Hardened Octal Buffer/Line Driver, with three-state outputs.

The output enable pins OE1, OE2 control the Three-State outputs.

If either enable is high the output will be in a high impedance state.

Key Features

  • Devices QML Qualified in Accordance with MIL-PRF-38535.
  • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96710 and Intersil’s QM Plan.
  • 1.25 Micron Radiation Hardened SOS CMOS.
  • Total Dose.
  • . . >300K RAD (Si).
  • Single Event Upset (SEU) Immunity: 100 MEV-cm /mg.
  • Dose R.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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ACS541MS January 1996 Radiation Hardened Octal Buffer/ Line Driver Three-State Pinouts 20 LEAD CERAMIC DUAL-IN-LINE MIL-STD-1835 DESIGNATOR, CDIP2-T20, LEAD FINISH C TOP VIEW OE1 A0 A1 A2 A3 A4 A5 A6 A7 1 2 3 4 5 6 7 8 9 20 VCC 19 OE2 18 Y0 17 Y1 16 Y2 15 Y3 14 Y4 13 Y5 12 Y6 11 Y7 Features • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96710 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si) • Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) • SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm /mg • Dose Rate Upset . . . . . . . . . . . . . . . .