Datasheet4U Logo Datasheet4U.com

ACTS573MS - Radiation Hardened Octal Three-State Transparent Latch

Description

The Intersil ACTS573MS is a Radiation Hardened Octal Transparent Latch with an active low output enable.

The outputs are transparent to the inputs when the latch enable (LE) is High.

When the latch goes low the data is latched.

Features

  • Devices QML Qualified in Accordance with MIL-PRF-38535.
  • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96725 and Intersil’s QM Plan.
  • 1.25 Micron Radiation Hardened SOS CMOS.
  • Total Dose.
  • . . >300K RAD (Si).
  • Single Event Upset (SEU) Immunity: 100 MEV-cm2/mg.
  • Dose R.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
ACTS74MS Radiation Hardened Dual-D Flip-Flop Intersil
ACT-D1M96S ACT-D1M96S High Speed 96 MegaBit 3.3V Synchronous DRAM Multichip Module Aeroflex Circuit Technology
ACT-E128K32 High Speed 4 Megabit EEPROM Multichip Module Aeroflex
ACT-F128K32 High Speed 4 Megabit FLASH Multichip Module Aeroflex
ACT-F128K8 High Speed 1 Megabit Monolithic FLASH Aeroflex

Other Datasheets by Intersil (Renesas)

Part Number Description
ACTS573T Radiation Hardened Octal Three-State Transparent Latch
ACTS541MS Radiation Hardened Octal Three-State Buffer/Line Driver
ACTS541T Radiation Hardened Octal Three-State Buffer/Line Driver
ACTS00MS Radiation Hardened Quad 2-Input NAND Gate
ACTS08MS Radiation Hardened Quad 2-Input AND Gate

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
ACTS573MS January 1996 Radiation Hardened Octal Three-State Transparent Latch Pinouts 20 LEAD CERAMIC DUAL-IN-LINE MIL-STD-1835 DESIGNATOR, CDIP2-T20, LEAD FINISH C TOP VIEW OE D0 D1 D2 D3 D4 D5 D6 D7 1 2 3 4 5 6 7 8 9 20 VCC 19 Q0 18 Q1 17 Q2 16 Q3 15 Q4 14 Q5 13 Q6 12 Q7 11 LE Features • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96725 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si) • Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) • SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg • Dose Rate Upset . . . . . . . . . . . . . . . .
Published: |