Datasheet4U Logo Datasheet4U.com

CTS20MS - Radiation Hardened Dual 4-Input NAND Gate

Datasheet Summary

Description

The Intersil HCTS20MS is a Radiation Hardened Dual 4-Input NAND Gate.

A low on any input forces the output to a High state.

The HCTS20MS utilizes advanced CMOS/SOS technology to achieve high-speed operation.

Features

  • 3 Micron Radiation Hardened SOS CMOS.
  • Total Dose 200K RAD (Si).
  • SEP Effective LET No Upsets: >100 MEV-cm2/mg.
  • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ).
  • Dose Rate Survivability: >1 x 1012 RAD (Si)/s.
  • Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse.
  • Latch-Up Free Under Any Conditions.
  • Military Temperature Range: -55 oC to +125oC GND 7.
  • Significant Power Reduction Compared to LSTTL ICs.

📥 Download Datasheet

Datasheet preview – CTS20MS

Datasheet Details

Part number CTS20MS
Manufacturer Intersil Corporation
File Size 132.27 KB
Description Radiation Hardened Dual 4-Input NAND Gate
Datasheet download datasheet CTS20MS Datasheet
Additional preview pages of the CTS20MS datasheet.
Other Datasheets by Intersil Corporation

Full PDF Text Transcription

Click to expand full text
HCTS20MS September 1995 Radiation Hardened Dual 4-Input NAND Gate Pinouts 14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-183S CDIP2-T14 TOP VIEW A1 1 B1 2 NC 3 C1 4 D1 5 Y1 6 14 VCC 13 D2 12 C2 11 NC 10 B2 9 A2 8 Y2 Features • 3 Micron Radiation Hardened SOS CMOS • Total Dose 200K RAD (Si) • SEP Effective LET No Upsets: >100 MEV-cm2/mg • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ) • Dose Rate Survivability: >1 x 1012 RAD (Si)/s • Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse • Latch-Up Free Under Any Conditions • Military Temperature Range: -55 oC to +125oC GND 7 • Significant Power Reduction Compared to LSTTL ICs • DC Operating Voltage Range: 4.5V to 5.5V • LSTTL Input Compatibility - VIL = 0.
Published: |