• Part: HCTS30MS
  • Manufacturer: Intersil
  • Size: 323.20 KB
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HCTS30MS Description

The Intersil HCTS30MS is a Radiation Hardened 8-Input NAND Gate. A high on all input forces the output to a low state. The HCTS30MS utilizes advanced CMOS/SOS technology to achieve high-speed operation.

HCTS30MS Key Features

  • 3 Micron Radiation Hardened SOS CMOS
  • Total Dose 200K RAD (Si)
  • SEP Effective LET No Upsets: >100 MEV-cm2/mg
  • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ)
  • Dose Rate Survivability: >1 x
  • Dose Rate Upset >10
  • Latch-Up Free Under Any Conditions
  • Military Temperature Range: -55oC to +125oC
  • Significant Power Reduction pared to LSTTL ICs
  • DC Operating Voltage Range: 4.5V to 5.5V