Intersil ACS03MS
Radiation Hardened Quad 2-Input NAND Gate
FEATURES
Pinouts● Devices QML Qualified in Accordance with MIL-PRF-38535
● Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96703 and Intersil’s QM Plan
● 1.25 Micron Radiation Hardened SOS CMOS
● Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si)
● Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ)
● SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg
● Dose Rate Upset . . . . . . . . . . . . . . . . >1011 RAD (Si)/s, 20ns Pulse
● Dose Rate Survivability . . . . . . . . . . . >1012 RAD (Si)/s, 20ns Pulse
● Latch-Up Free Under Any Conditions
● Military Temperature Range . . . . . . . . . . . . . . . . . . -55oC to +125oC 14 PIN CERAMIC DUAL-IN-LINE MIL-STD-1835 DESIGNATOR CDIP2-T14, LEAD FINISH C TOP VIEW A1 1 B1 2 Y1 3 A2 4 B2 5 Y2 6 GND 7 14 VCC 13 B4 12 A4 11 Y4 10 B3