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HCTS00MS Datasheet PDF

Intersil HCTS00MS

HCTS00MS is a Radiation Hardened Quad 2-Input NAND Gate. The HCTS00MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family.
Part No. HCTS00MS
Datasheet HCTS00MS Download
Manufacturer
Intersil
Description Radiation Hardened Quad 2-Input NAND Gate
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HCTS00MS datasheet page 1 preview

FEATURES

● 3 Micron Radiation Hardened SOS CMOS
● Total Dose 200K RAD (Si)
● SEP Effective LET No Upsets: >100 MEV-cm2/mg
● Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ)
● Dose Rate Survivability: >1 x 1012 RAD (Si)/s
● Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse
● Cosmic Ray Upset Immunity < 2 x 10-9 Errors/Gate Day (Typ)
● Latch-Up Free Under Any Conditions
● Military Temperature Range: -55oC to +125oC
● Significant Power Reduction Compared to LSTTL ICs
● DC Operating Voltage Range: 4.5V to 5.5V
● LSTTL Input Compatibility - VIL = 0.8V Max - VIH = VCC/2 Min
● CMOS Input Compatibility Ii ≤ 5µA at VOL, VOH 14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK) MIL-STD-1835 CDFP3-F14 TOP VIEW A1 B1 Y1 1 2 3 4 5 6 7 14 13 12 11 10 9 8 VCC B4 A4 Y4 B3 A3 Y3

DESCRIPTION

The Intersil A high on both inputs forces the output to a Low state. The HCTS00MS is supplied in a 14 lead Ceramic flatpack (K suffix) or a SBDIP Package (D suffix). A2 B2 Y2 GND TRUTH TABLE INPUTS An L Bn L...
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