Intersil HCTS30MS
HCTS30MS is a Radiation Hardened 8-Input NAND Gate. The HCTS30MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family.| Part No. | HCTS30MS |
|---|---|
| Datasheet | HCTS30MS Download |
| Manufacturer |  Intersil |
| Description | Radiation Hardened 8-Input NAND Gate |
| Buy | Stock & Price |
FEATURES
● 3 Micron Radiation Hardened SOS CMOS● Total Dose 200K RAD (Si)
● SEP Effective LET No Upsets: >100 MEV-cm2/mg
● Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ)
● Dose Rate Survivability: >1 x
● Dose Rate Upset >10 10 1012 RAD (Si)/s RAD (Si)/s 20ns Pulse
● Latch-Up Free Under Any Conditions
● Military Temperature Range: -55oC to +125oC
● Significant Power Reduction Compared to LSTTL ICs
● DC Operating Voltage Range: 4.5V to 5.5V
● LSTTL Input Compatibility - VIL = 0.8V Max - VIH = VCC/2 Min
● Input Current Levels Ii ≤ 5µA at VOL, VOH A 14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK) MIL-STD-1835 CDFP3-F14 TOP VIEW 1 2 3 4 5 6 7 14 13 12 11 10 9 8 VCC NC H G NC NC Y
DESCRIPTION
The Intersil A high on all input forces the output to a low state. B C D E F GND Ordering Information PART NUMBER HCTS30DMSR HCTS30KMSR HCTS30D/Sample HCTS30K/Sample HCTS30HMSR TEMPERATURE RANGE -55oC to +125oC -55oC to +125oC +25oC +25oC +25oC SCREENING LEVEL Intersil Class S...
