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IS-1009EH - Radiation Hardened 2.5V Reference

This page provides the datasheet information for the IS-1009EH, a member of the IS-1009RH Radiation Hardened 2.5V Reference family.

Datasheet Summary

Description

PKG.

DWG.# TYPE TEMP.

Features

  • Electrically screened to SMD #5962-00523.
  • QML qualified per MIL-PRF-38535 requirements.
  • EH version acceptance tested to 50krad(Si) (LDR).
  • Radiation environment - IS-1009EH - High dose rate (50-300rad(Si)/s).
  • . 300 krad(Si) - Low dose rate (0.01rad(Si)/s).
  • . . . . 50krad(Si).
  • Radiation environment - IS-1009RH - High dose rate (50-300rad(Si)/s).
  • . 300 krad(Si).
  • Latch-up immune.

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Datasheet preview – IS-1009EH

Datasheet Details

Part number IS-1009EH
Manufacturer Intersil
File Size 210.66 KB
Description Radiation Hardened 2.5V Reference
Datasheet download datasheet IS-1009EH Datasheet
Additional preview pages of the IS-1009EH datasheet.

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Full PDF Text Transcription

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IS-1009RH, IS-1009EH Radiation Hardened 2.5V Reference The Radiation Hardened IS-1009RH, IS-1009EH are a 2.5V shunt regulator diode is designed to provide a stable 2.5V reference over a wide current range. These devices are designed to maintain stability over the full military temperature range and over time. The 0.2% reference tolerance is achieved by on-chip trimming. An adjustment terminal is provided to allow for the calibration of system errors. The use of this terminal to adjust the reference voltage does not effect the temperature coefficient. Constructed with the dielectrically isolated EBHF process, these devices are immune to single event latch-up and have been specifically designed to provide highly reliable performance in harsh radiation environments.
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