Intersil ISL5100A
The ISL55100 is a Quad pin driver and window comparator fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn In (TDBI) applications, where cost, functional density, and power are all at a premium. This IC incorporates four channels of programmable drivers and window comparators into a small 72 Ld QFN package.FEATURES
● Low Driver Output Resistance - ROUT Maximum: ISL55100A 7.0Ω● 18V I/O Range
● 50MHz Operation
● 4 Channel Driver/Receiver Pairs with Per Pin Flexibility
● Dual Level - Per Pin - Input Thresholds
● Differential or Single Ended Digital Inputs
● User Defined Comparator Output Levels
● Low Channel to Channel Timing Skew
● Small Footprint (72 Ld QFN)
● Pb-Free Plus Anneal Available (RoHS Compliant)
APPLICATIONS
● Burn In ATE● Wafer Level Flash Memory Test
● LCD Panel Test
● Low Cost ATE
● Instrumentation
● Emulation
● Device Programmers Functional Block Diagram QUAD - WIDE RANGE, LOW ROUT, TRI-STATEABLE - DRIVERS VH(0-3) DATA+(0-3) DATA-(0-3) DRVEN+(0-3) + + - DOUT(0-3) VL(0-3) Ordering Information PART NO. PART TEMP. MARKING RANGE (°C) PACKAGE -40 to +85 PKG. DWG. # DRVEN-(0-3) ISL55100AIRZ ISL55100 (See Note) AIRZ 72 Ld QFN L72.10x10 (Pb-free) Add “-T” suffix for tape and reel. NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/...