CNH32R106M-TM Datasheet | MARUWA

MARUWA GENERAL CATALOG PERFORMANCE AND TEST METHOD .. EMI FILTERS Item Dissipation Factor Withstanding voltage Insulation resistance Adhesion strength of termination Vibration resistance Resistance to soldering heat Visual Capacitance Dissipation factor Visual Capacitance Dissipation factor Insulation resistance Withstanding voltage Solderability Temperature cycling Humidity load test Life test at high temperature load Visual Capacitance Dissipation factor Insulation resistance Withstanding voltage Visual Capacitance Dissipation factor Insulation resistance Visual Capacitance Dissipation factor Insulation resistance Flexion Visual Capacitance CG, UJ Performance 2.5% or less ‫ء‬1) Testing method and conditions F (In accordance with JIS C5101-1) 5% or less ‫ء‬1) CG : 1MHz UJ, R, F : 1k Hz Measurement voltage : 0.5~2Vrms No insulation breakdown and no failure. No less than 10,000M⍀ or 500M⍀ - ␮F, whichever is smaller. Application time is 1~5seconds. CG, UJ : 300% of rated voltage R, F : 250% of rated voltage Rated voltage is applied for 1 minute. Chip 5N Substrate No peeling-off or exfoliation shall be manifest or recognizable in its incipient stages. Solder a specimen on the testing jig shown on the left and apply a force of 5N (0.51kgf) in the direction indicated by arrow. No remarkable damage Within specified tolerance Initial standard values must be...