• Part: MX27517
  • Description: Single 4A Peak Current Low-Side Gate Driver
  • Manufacturer: MAXINMICRO
  • Size: 470.29 KB
Download MX27517 Datasheet PDF
MAXINMICRO
MX27517
MX27517 is Single 4A Peak Current Low-Side Gate Driver manufactured by MAXINMICRO.
features necessary to drive low-side enhancement mode Gallium Nitride (Ga N) FETs. The MX27517 provides inverting and noninverting inputs to satisfy requirements for inverting and noninverting gate drive in a single device type. The inputs of the MX27517 are TTL/CMOS Logic patible and withstand input voltages up to 18 V regardless of the VDD voltage. The MX27517 has split gate outputs, providing flexibility to adjust the turn on and turn off strength independently. The MX27517 has fast switching speed and minimized propagation delays, facilitating high-frequency operation. The MX27517 is available in a 6-pin SOT23-6 package. FEATURES - Independent Source and Sink Outputs for Controllable Rise and Fall Times - 4V to 18V Single Power Supply - 4.0A Peak Sink and Source Drive Current - 0.55Ω Open-drain Pulldown Sink Output - 0.70Ω Open-drain Pullup Source Output - 10ns (Typical) Propagation Delay - Matching Delay Time Between Inverting and Noninverting Inputs - TTL/CMOS Logic Inputs - Up to 18V Logic Inputs (Regardless of VDD Voltage) MX27517 Single 4A Peak Current Low-Side Gate Driver - Low Input Capacitance: 2.5p F (Typical) - - 40°C to 125°C Operating Temperature Range - 6-Pin SOT23-6L APPLICATIONS Battery Management System Lidar Driver for Distance Test Boost Converters Flyback and Forward Converters Secondary Synchronous FETs Drive in Isolated Topologies These are Pb-free device Motor Control GENERAL INFORMATION Ordering information Part Number MX27517 Description SOT23-6L Package dissipation rating Package SOT-23 (6) RθJA(℃/W) 108.1 Absolute maximum ratings Parameter VDD to GND IN+ to GND OUT to GND Junction temperature Storage temperature, Tstg Leading temperature (soldering,10secs) ESD Susceptibility HBM Value -0.3 to 20V -0.3 to 20V -0.3 to VDD+0.3V 150℃ -55 to 150℃ 260℃ ±2000V Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may...