Datasheet Details
| Part number | DS21Q59 |
|---|---|
| Manufacturer | Maxim Integrated (now Analog Devices) |
| File Size | 17.14 KB |
| Description | RELIABILITY REPORT FOR DS21Q59/ REV A2 |
| Datasheet | DS21Q59_MaximIntegratedProducts.pdf |
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Overview: 02/03/2004 RELIABILITY REPORT FOR DS21Q59, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi. ph: 972-371-3726 fax: 972-371-6016 mbl: 214-435-6610 Conclusion: The following qualification successfully meets the quality and reliability standards required of all Dallas Semiconductor products and processes: DS21Q59, Rev A2 In addition, Dallas Semiconductor's continuous reliability monitor program ensures that all outgoing product will continue to meet Maxim's quality and reliability standards. The current status of the reliability monitor program can be viewed at http://.maxim-ic./TechSupport /dsreliability.html.
| Part number | DS21Q59 |
|---|---|
| Manufacturer | Maxim Integrated (now Analog Devices) |
| File Size | 17.14 KB |
| Description | RELIABILITY REPORT FOR DS21Q59/ REV A2 |
| Datasheet | DS21Q59_MaximIntegratedProducts.pdf |
|
|
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: A description of this device can be found in the product data sheet.
You can find the product data sheet at http://dbserv.maxim-ic./l_datasheet3.cfm.
Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerated.
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| DS21S07A | SCSI Terminator |
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| DS2030W | 3.3V Single-Piece 256k Nonvolatile SRAM |
| DS2030Y | Single-Piece 256kb Nonvolatile SRAM |