79LV0408 Description
Maxwell Technologies’ 79LV0.
79LV0408 Key Features
- Four 128k x 8-bit EEPROMs MCM
- RAD-PAK® radiation-hardened against natural
- Total dose hardness
- > 100 krad (Si), depending upon space mission
- Excellent Single event effects @ 25°C
- SEL > 120 MeV cm2/mg (Device)
- SEU > 85 MeV cm2/mg(Memory Cells)
- SEU > 18 MeV cm2/mg (Write Mode)
- SET > 40 MeV cm2/mg (Read Mode)
- Package