UPD703111 Overview
Preliminary User’s Manual V850E/ME2 Hardware TM 32-Bit Single-Chip Microcontroller µPD703111 Document No. Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred.