| Part number | UPD70F3114 |
|---|---|
| Download | UPD70F3114 Datasheet (PDF) |
| File Size | 3.72 MB |
| Manufacturer | NEC |
| Description | 32-Bit Single-Chip Microcontrollers |
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| Part Number | Description |
|---|---|
| UPD70F3116 | 32-Bit Single-Chip Microcontrollers |
| UPD70F3208 | (UPD70F3208 - UPD70F3217) 32-Bit Single-Chip Microcontrollers |
| UPD70F3209 | (UPD70F3208 - UPD70F3217) 32-Bit Single-Chip Microcontrollers |
| UPD70F3212 | (UPD70F3212 - UPD70F3215) 32-Bit Single-Chip Microcontrollers |
| UPD70F3213 | (UPD70F3212 - UPD70F3215) 32-Bit Single-Chip Microcontrollers |
User’s Manual V850E/IA2 Hardware TM 32-Bit Single-Chip Microcontrollers µPD703114 µPD70F3114 Document No. Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred.
