78F0058 Description
U12013EJ3V2UD00 (3rd edition) Date Published February 2003 N CP (K) 1997, 2003 Printed in Japan [MEMO] .. 2 User's Manual U12013EJ3V2UD NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation.