78F9222 Datasheet PDF

Preliminary User’s Manual 78K0S/KA1+ 8-Bit Single-Chip Microcontrollers µPD78F9221 µPD78F9222 Document No. U16898EJ1V0UD00 (1st edition) Date Published November 2003 N CP(K) © Printed in Japan 2003 [MEMO] 2 Preliminary User’s Manual U16898EJ1V0UD NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap.