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HEF4511B - BCD to 7-segment latch/decoder/driver

General Description

The HEF4511B is a BCD to 7-segment latch/decoder/driver with four address inputs (D0 to D3), an active HIGH latch enable input (LE), an active LOW ripple blanking input (BL), an active LOW lamp test input (LT), and seven active HIGH NPN bipolar transistor segment outputs (Qa to Qg).

Key Features

  • Fully static operation.
  • 5 V, 10 V, and 15 V parametric ratings.
  • Standardized symmetrical output characteristics.
  • Specified from 40 C to +85 C and 40 C to +125 C.
  • Complies with JEDEC standard JESD 13-B 3. Ordering information Table 1. Ordering information All types operate from 40 C to +125 C. Type number Package Name.

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Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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HEF4511B BCD to 7-segment latch/decoder/driver Rev. 7 — 11 November 2011 Product data sheet 1. General description The HEF4511B is a BCD to 7-segment latch/decoder/driver with four address inputs (D0 to D3), an active HIGH latch enable input (LE), an active LOW ripple blanking input (BL), an active LOW lamp test input (LT), and seven active HIGH NPN bipolar transistor segment outputs (Qa to Qg). When LE is LOW and BL is HIGH, the state of the segment outputs (Qa to Qg) is determined by the data on D0 to D3. When LE goes HIGH, the last data present on D0 to D3 is stored in the latches and the segment outputs remain unchanged. When LT is LOW, all of the segment outputs are HIGH independent of all other input conditions. With LT HIGH, a LOW on BL forces all segment outputs LOW.