• Part: MN100314-X
  • Description: LOW POWER QUINT DIFFERENTIAL LINE RECEIVER
  • Manufacturer: National Semiconductor
  • Size: 106.30 KB
Download MN100314-X Datasheet PDF
National Semiconductor
MN100314-X
MN100314-X is LOW POWER QUINT DIFFERENTIAL LINE RECEIVER manufactured by National Semiconductor.
Description The 100314 is a monolithic quint differential line receiver with emitter-follower outputs. An internal reference supply (Vbb) is available for single-ended reception. When used in single-ended operation, the only mode allowed is to connect the plementary inputs to Vbb. Unlike other F100K ECL devices, the inputs do not have input pull-down resistors. Active current sources provide mon-mode rejection of 1.0V in either the positive or negative direction. A defined output state exists if both inverting and non-inverting inputs are at the same potential between Vee and Vcc. The defined state is logic HIGH on the Oa-Oe outputs. Industry Part Number NS Part Numbers 100314DMQB 100314FMQB 100314J-QMLV 100314W-QMLV Prime Die F314 Processing MIL-STD-883, Method 5004 Subgrp Description 1 2 3 4 5 6 7 8A 8B 9 10 11 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( o C) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 Quality Conformance Inspection MIL-STD-883, Method 5005 MN100314-X REV 1A0 MILITARY DATA SHEET Features 35% power reduction of the F100114 2000V ESD protection Pin/function patible with 100114 Voltage pensated operating range = -4.2V to -5.7V Available to MIL-STD-883 Available to industrial grade temperature range MN100314-X REV 1A0 MILITARY DATA SHEET (Absolute Maximum Ratings) (Note 1) Storage Temperature (Tstg) -65 C to +150 C Maximum Junction Temperature (Tj) Ceramic Plastic Vee Pin Potential to Ground Pin Input Voltage (DC) Vee to +0.5V Output Current (DC Output HIGH) -50m A ESD (Note 2) > 2000V Note 1: Note 2: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. ESD testing conforms to MIL-STD-883, Method 3015. +175 C +150 C -7.0V...