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National Semiconductor
MNCLC449A-X
MNCLC449A-X is ULTRA-WIDEBAND MONOLITHIC OP AMP manufactured by National Semiconductor.
Description The linear CLC449 is an ultra-high-speed monolithic op amp, with a typical -3d B bandwidth of 1.2GHz at a gain of +2. This wideband op amp supports rise and fall times less than 1ns, settling time of 6ns (to 0.2%) and slew rate of 2500V/us. The CLC449 achieves 2nd harmonic distortion of -68d Bc at 5MHz at a low supply current of only 12m A. These performance advantages have been achieved through improvements in linear's proven current feedback topology bined with a high-speed plementary bipolar process. The DC to 1.2GHz bandwidth of the CLC449 is suitable for many IF and RF applications as a versatile op amp building block for replacement of AC coupled discrete designs. Operational amplifier functions such as active filters, gain blocks, differentiation, addition, subtraction and other signal conditioning functions take full advantage of the CLC449's unity-gain stable closed-loop performance. The CLC449 performance provides greater headroom for lower frequency applications such as ponent video, high-resolution workstation graphics, and LCD displays. The amplifier's 0.1d B gain flatness to beyond 200MHz, plus 0.8ns 2V rise and fall times are ideal for improved time domain performance. In addition, the 0.03%/0.02 differential gain/phase performance allows system flexibility for handling standard NTSC and PAL signals. In applications using high-speed flash A/D and D/A converters, the CLC449 provides the necessary wide bandwidth (1.2GHz), settling (6ns to 0.2%) and low distortion into 50 Ohms loads to improve SFDR. Industry Part Number CLC449A NS Part Numbers CLC449AJ-MLS CLC449AJ-QML Prime Die VB1851A Controlling Document 5962-9752001MPA Processing MIL-STD-883, Method 5004 Subgrp Description 1 2 3 4 5 6 7 8A 8B 9 10 11 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( o C) +25 +125...