Datasheet Details
| Part number | SCAN16512 |
|---|---|
| Manufacturer | National Semiconductor (now Texas Instruments) |
| File Size | 149.81 KB |
| Description | Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver |
| Datasheet | SCAN16512_NationalSemiconductor.pdf |
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Overview: SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs August 2002 SCAN16512 Low Voltage Universal 16-bit IEEE 1149.
| Part number | SCAN16512 |
|---|---|
| Manufacturer | National Semiconductor (now Texas Instruments) |
| File Size | 149.81 KB |
| Description | Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver |
| Datasheet | SCAN16512_NationalSemiconductor.pdf |
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The SCAN16512 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals.
This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode.
This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST).
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