SCAN182245A Datasheet PDF

National Semiconductor SCAN182245A

The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals This device is compliant with IEEE 1149 1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI) Test Data Out (TDO) Test Mode Select (TMS) and Test Clock (TCK) Features Y Y Y Y Y Y Y Y Y Y High performance BiCMOS technology 25X series resistors in outputs eliminate the need for...