| Part number | SCAN182245A |
|---|---|
| Manufacturer | National Semiconductor (now Texas Instruments) |
| File Size | 205.10 KB |
| Description | Non-Inverting Transceiver |
| Datasheet | SCAN182245A_NationalSemiconductor.pdf |
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The SCAN182245A is a high performance BiCMOS bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals This device is pliant with IEEE 1149 1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI) Test Data Out (TDO) Test Mode Select (TMS) and Test Clock (TCK)
| Brand Logo | Part Number | Description | Other Manufacturers |
|---|---|---|---|
 |
SCAN182245A | Non-Inverting Transceiver | Fairchild Semiconductor |
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