SCAN25100 Key Features
- IEEE 1149.1 and 1149.6
- At-speed BIST pattern generator/verifier
- Multiple loopback modes n 1.8V or 3.3V patible parallel bus interface n 100-pin TQFP package with exposed dap n Industri
- Part: SCAN25100
- Description: CPRI SerDes
- Manufacturer: National Semiconductor
- Size: 645.64 KB
Related National Semiconductor Datasheets
| Part Number | Description |
|---|---|
| SCAN12100 | CPRI SerDes |
| SCAN16512 | Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver |
| SCAN16602 | Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver |
| SCAN182245A | Non-Inverting Transceiver |
| SCAN18245T | Non-Inverting Transceiver |