Download AR629AU9 Datasheet PDF
National Semiconductor
AR629AU9
AR629AU9 is Gate Array manufactured by National Semiconductor.
Description The AR629A Terminal Controller (TC) is a bus interface device (terminal) meeting the requirements of the ARINC 629 Digital Autonomous Terminal Access munication databus specification housing in a 180 CPGA. ARINC 629 is a multiple transmitter, broadcast type, autonomous terminal access, time division multiplex system that supports deterministic data muncation over a mon single channel transmission medium. The databus protocol is Carrier Sense/Multiple Access-Clash Avoidance on bus (CS/MA-CA) permitting 100% utilization of the bus bandwidth during overload conditions. Equal terminal access to the bus is provided at all times. Industry Part Number AR629A-U9MIO NS Part Numbers AR629AU9/883 Prime Die SCX6B150MIO Controlling Document 5962-9958101QXC Processing MIL-STD-883, Method 5004 Subgrp Description 1 2 3 4 5 6 7 8 8 9 10 11 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( o C) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 Quality Conformance Inspection MIL-STD-883, Method 5005 MNAR629A-X REV 0A0 MICROCIRCUIT DATA SHEET (Absolute Maximum Ratings) (Note 1) Vdd, Supply Voltage MIN -0.5 Vi, Vo Input or Output Voltage MIN -.05 Ts, Storage Temperature MIN -65 Power Dissipation 500m W Lead Temperature No longer than 10 seconds Thermal Resistance, PGA Junction to Ambient Zero Air Flow MIN MAX +300 MAX +26 UNITS C UNITS C/W MAX +150 UNITS C MAX UNITS Vdd + 0.5 V MAX +7.0 UNITS V Note 1: Operation in excess of those max and min ratings listed below may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated under (DC Characteristics) is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Remended...