DS26LV31QML
DS26LV31QML is 3V Enhanced CMOS Quad Differential Line Driver manufactured by National Semiconductor.
Description
The DS26l V31 is a high-speed quad differential CMOS driver that is parable to the TIA/EIA-422-B and ITU-T V.11 standards. The CMOS DS26LV31 features low static ICC of 125 µA Max which makes it ideal for battery powered and power conscious applications. Differential outputs have the same VOD guarantee (≥2V) as the 5V version. The EN and EN inputs allow active Low or active High control of the TRI-STATE outputs. The enables are mon to all four drivers. Protection diodes protect all the driver inputs against electrostatic discharge. The driver and enable inputs (DI, EN, EN) are patible with low voltage LVTTL and LVCMOS devices.
Features n parable to both TIA/EIA-422 and ITU-T V.11 standards. n Interoperable with existing 5V RS-422 networks n Low quiescent current n Pin patiable with DS26C31
Ordering Information
NS Part Number DS26LV31W-QML SMD Part Number 5962- 9858401QFA NS Package Number W16A Package Description
16 Lead Ceramic Flatpack
Connection Diagram
Ceramic Flatpack
Top View See NS Package Number W16A
© 2006 National Semiconductor Corporation
DS201634
.national.
Absolute Maximum Ratings (Notes 1, 2)
Supply Voltage (VCC) DC Input Voltage (VI) DC Output Voltage (VO) Power off Clamp Diode Current (IIK, IOK) DC Output Current, per Pin (IO) Storage Temperature Range (TStg) Lead Temperature (TL) Soldering, 4 seconds Maximum Power Dissipation +25˚C (Note 3) Thermal Resistance θJA θJC 134˚C/W 12.5˚C/W -0.5V to 7.0V -0.5V to VCC+0.5V -0.5V to 7V
± 20m A ± 150m A
-65˚C ≤ TA ≤ +150˚C 260˚C 1119m W
Remended Operating Conditions
Supply Voltage (v CC) DC input or Output Voltage (VI, VO) Operating Temperature Range (TA) 3.0V to 3.6V 0V to VCC
- 55˚C ≤ TA ≤ +125˚C
Quality Conformance Inspection
Mil-Std-883, Method 5005
- Group A Subgroup 1 2 3 4 5 6 7 8A 8B 9 10 11 12 13 14 Description
Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional...