LF6197 Datasheet | National Semiconductor

Description The LF6197 is a monolithic sample-and-hold (S H) amplifier that uses a proprietary ‘‘current-multiplexed sample-andhold’’ technique to offer extremely high speed while maintaining 12 bits or higher accuracy The device is built using National’s advanced junction-isolated VIPTM (Vertically Integrated PNP) and BI-FETTM process technologies The LF6197 acquires a 10V step input to within g0 01% in 160 ns and has 10 m V hold step error when going from sample to hold mode The input offset voltage in the sample mode is typically 3 m V Even at extremely fast acquisition speeds no promises are made in the droop rate which is 0 6 m V ms When configured for unity gain the DC gain error is 0 03% The feedthrough attenuation in the hold mode is 83 d B at DC and 77 d B at 100 k Hz The LF6197 can be externally configured for either inverting or non-inverting gains thus offering additional flexibility to the user The device includes an internal 10 p F hold capacitor BI-FETTM and VIPTM are trademarks of National Semiconductor Corporation Block Diagram Features Y Operates with supply voltages from g5V to g18V Y CMOS TTL and ECL patible logic input Y Adjustable inverting or non-inverting gain Y Internal hold capacitor Y High power-supply rejection in both sample and hold modes Key Specifications Y Acquisition time (10V step to 0 01%) 160 ns Y Hold mode settling time (10V step to 0 01%) 50 ns Y Droop rate 0 6 m V ms Y Hold step 10 m V Y Aperture jitter Y Feedthrough attenuation at DC 8 psrms 83 d B Y Small signal bandwidth 25 MHz Applications Y High-speed data acquisition systems Y Automatic test equipment Y High-speed instrumentation Y Replaces expensive hybrid sample-and-hold amplifiers Connection Diagram C1995 National Semiconductor Corporation TL H 11381 Top View TL H 11381- 2 Ordering Information Industrial (0 C k TAk a70 C) LF6197CCJ Package J14A Ceramic DIP TL H 11381- 1 RRD-B30M115 Printed in U S A Absolute Maximum Ratings (Notes 1 2) Positive Supply...