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OP804TX - (OP803TX - OP805TX) Hi-Reliability NPN Sil icon Phototransistor

This page provides the datasheet information for the OP804TX, a member of the OP803TX (OP803TX - OP805TX) Hi-Reliability NPN Sil icon Phototransistor family.

Datasheet Summary

Description

Each device in the OP803, OP804 and OP805TX/TXV series consists of a high reliability NPN phototransistor mounted in a lensed, hermetically sealed, TO-18 package.

All devices are 100% screened per Table II of MIL-PRF-19500.

Typical screening and lot acceptance tests are provided on page 13-4.

Features

  • High reliability screening patterned.
  • Each lot subjected to Group A & B Lot.
  • Lensed for high sensitivity.
  • Mechanically and spectrally matched to the OP235TX/TXV and OP236TX/TXV series IREDs Acceptance after MIL-PRF-19500 Absolute Maximum Ratings (TA = 25o C unless otherwise noted) Storage Temperature Range.
  • . . . . -65o C to +150o C o o Operating Temperature Range.
  • .

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Datasheet preview – OP804TX

Datasheet Details

Part number OP804TX
Manufacturer OPTEK Technologies
File Size 39.13 KB
Description (OP803TX - OP805TX) Hi-Reliability NPN Sil icon Phototransistor
Datasheet download datasheet OP804TX Datasheet
Additional preview pages of the OP804TX datasheet.
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Full PDF Text Transcription

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Product Bulletin OP803TX September 1996 Hi-Reliability NPN Silicon Phototransistor Types OP803TX/TXV, OP804TX/TXV, OP805TX/TXV Features • High reliability screening patterned • Each lot subjected to Group A & B Lot • Lensed for high sensitivity • Mechanically and spectrally matched to the OP235TX/TXV and OP236TX/TXV series IREDs Acceptance after MIL-PRF-19500 Absolute Maximum Ratings (TA = 25o C unless otherwise noted) Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65o C to +150o C o o Operating Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55 C to +125 C Lead Soldering Temperature [1/16 inch (1.6 mm) from case for 5 sec. with soldering o (1) iron] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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