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Serial EEPROM Endurance
AN537
Everything a System Engineer Needs to Know About Serial EEPROM Endurance
The term “endurance” has become a confusing parameter for both users and manufacturers of EEPROM products. This is largely because many semiconductor vendors treat this important application-dependent reliability parameter as a vague specmanship topic. As a result, the system engineer often designs without proper reliability information or under-utilizes the EEPROM as an effective solution. Endurance (the number of times an EEPROM cell can be erased and rewritten without corrupting data) is a measure of the device’s reliability, not its parametric performance.
AN5385K Datasheet
